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dc.contributor.authorSelvi, Ali Osman
dc.contributor.authorFerikoğlu, Abdullah
dc.contributor.authorGüzel, Derya
dc.date.accessioned2022-02-09T12:29:26Z
dc.date.available2022-02-09T12:29:26Z
dc.date.issued2018
dc.identifier.isbn978-1-5386-4184-2
dc.identifier.urihttps://hdl.handle.net/20.500.14002/260
dc.description2nd International Symposium on Multidisciplinary Studies and Innovative Technologies (ISMSIT) -- OCT 19-21, 2018 -- Kizilcahamam, TURKEYen_US
dc.description.abstractWith the help of Brain Computer Interface systems, people can generate commands to the computer environment by using their ability to think and focus. Some of these systems are designed using P300 signals. One of the components of the electroencephalography (EEG) signal is the positive deflection potential of approximately 300ms after the stimulus. The participants were asked to follow two different scenarios by using a computer with the help of the software prepared on Unity. The study was performed on 6 participants. In this study, stimulus time which is one of the basic elements of BBA systems was compared by using deep learning method. Transition time between stimulus in tasks was chosen from 125 to 250 milliseconds. In the classification made with deep learning, the transition time between the two stimuli resulted in 100% performance in the training data. In test data, the 125 milisecond transition time achieved 80% performance. In test data, the 250 milisecond transition time achieved 40% performance.en_US
dc.description.sponsorshipIEEE Turkey Sect, Karabuk Univ, Kutahya Dumlupinar Univen_US
dc.language.isoturen_US
dc.publisherIEEEen_US
dc.relation.ispartof2018 2nd International Symposium on Multidisciplinary Studies and Innovative Technologies (Ismsit)en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectElectroencephalographyen_US
dc.subjectBrain Computer Interfaceen_US
dc.subjectDeep Learningen_US
dc.subjectP300en_US
dc.subjectEmotiven_US
dc.titleComparing the stimulus time of the P300 Based Brain Computer Interface Systems with the Deep Learning Methoden_US
dc.typeproceedingsPaperen_US
dc.departmentFakülteler, Teknoloji Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümüen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.authorscopusid56437564800
dc.authorscopusid22333395900
dc.authorscopusid57191865345
dc.identifier.wosWOS:000467794200001en_US
dc.identifier.scopus2-s2.0-85060818243en_US


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